TAP4000 Single-ended Active FET Probe

Features:

• TAP4000: ≥4 GHz Probe Bandwidth
• ≥0.8 pF Input Capacitance
• 40 kilohms Input Resistance
• -4 V to +4 V Input Dynamic Range
• -10 V to +10 V DC Input Offset Range
• Small Compact Probe Head for Probing Small Geometry Circuit Elements
• DUT Attachment Accessories Enable Connection to SMDs As Small As 0.5 mm Pitch
• Robust Design for Reliability

Standard Accessories: Y-lead adapter (2 ea) and 3 in. ground lead (3 ea), Micro CKT test tip (2 ea), Customizable ground lead (set of 5), Color band kit (5 colored pairs), Pogo pin ground (set of 10), Square pin socket (set of 10), Push-in probe tip (set of 10), Right-angle adapter (set of 10), SureToe Adapter (set of 4), Antistatic wrist strap (1 ea), Nylon carrying case (1 ea), Plastic accessory case (1 ea), and an Instruction manual.

TAP4000 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs. Specifically designed for use and direct connection to oscilloscopes with the TekVPI probe interface, the TAP4000 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:

• Versatile mechanical performance
  • Small compact probe head for probing small geometry circuit elements
  • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
  • Robust design for reliability
• Easy to use
  • Connects directly to oscilloscopes with the TekVPI probe interface
  • Provides automatic units scaling and readout on the oscilloscope display
  • Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
  • Remote GPIB/USB probe control through the oscilloscope

Applications:

• Verification, debug, and characterization of high-speed designs
• Signal integrity, jitter, and timing analysis
• Manufacturing engineering and test
• Signals with voltage swings up to 8 Vp-p